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The most commonly used instrument for the
measurement of the optical performance of thin-film coatings is
a spectrometer. Using a
StellarNet fiber optic spectrometer coupled to a reflectance
probe and fiber optic light source, it is possible to measure
film thickness by detecting the sinusoidal fringe pattern from
the samples specular reflectance.
Choose between various StellarNet spectrometers to suite your
Thin Film and/or optical measurement requirement.
StellarNet offers EPP2000 model spectrometers that range from
190-2300nm. Dual channel configurations, extended range
detectors, or high resolution optics can be employed to suite
your optical measurement.
See the StellarNet
Spectrometers section to learn more various EPP2000 models
or ask a StellarNet sales representative to determine your
requirements.
Optical Filter Measurements
A fiber optic sample probe is powered with
a fiber optic light source
- SL1 tungsten krypton bulb (see other
options below). For measuring the color of solid samples,
an integrating sphere, such as the
IC2, is used in place of the fiber optic reflectance probe to
improve measurement consistency. The IC2 also acts as a cosine
receptor to improve irradiance measurements. A white
reflectance standard, such as the RS50 also listed below, is required to generate
a reference for subsequent measurement of solid samples. For
more information on color applications, refer to the section
entitled " Color Measurement Systems".
Light Sources and
Integrating Spheres
Software is included to provide CIE 1976 L* a* b*
(CIELAB) color coordinate data for measurement and tolerancing. The
L* (L star) is a measure of Brightness. The a* and b* are the color
coordinates that range from -90 to +90 in the CIELAB color space
"circle". For a* (a star), -90=green and +90=red. For b* (b star),
-90=blue and +90=yellow. To perform color tolerancing, a standard
sample is measured and saved for future comparisons. A Delta E*
value is then calculated to show the color differences with other
samples. Double beam and multi-beam color monitors for continuous
industrial process monitoring are configurable by adding additional
channels.
Free SpectraWiz Software
The powerful SpectraWiz® 32
bit spectrometer software is provided free of charge
with every spectrometer instrument. This includes
drivers and customizable software for operation on Win95
/ Win98 / WinNT /
WinME / Win2000 /WinXP.
The SpectraWiz software is considered the "Swiss Army Knife of
Spectroscopy and may be used to accurately measure wavelength emissions,
reflectance, transmission, absorption, concentrations, and absolute
intensities. In addition to real-time spectroscopy,
SpectraWiz® has built-in applications for SpectroRadiometry,
SpectroColorimetry, ChemWiz chemistry lab concentration analyzer, and UV
level monitors.
Power and
InterFace
Portable spectrometers include
a USB-2 interface cable and +5VDC power adapter for
120VAC-60H (light sony transformers with
U.S. style 2 prong plugs). For usage
outside the U.S.A., we offer an upgrade to universal power adapters.
EPP2000-NIR-InGaAs- silver film for
reference surface
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StellarNet Thin Film and Optical Measurement System- SL1 10,000 hour tungsten krypton bulb,
EPP2000C-25 Concave Grating Spectrometer, and Reflectance accessories.
StellarNet
Reflectance Accessories-
The Reflectance Probe has 6 illuminating fibers and 1 read fiber
bundled together. As an option, the2R probe has 5 illuminating
fibers and 2 read fibers. Fibers are
offered in 400μm
and 600μm diameters. The RS50 is a
50mm diameter white reflectance standard made of Halon. It is used to
take reference measurements using the R400 Reflectance Probe. The white
standard will reflect >97% of the light from 300-1700nm.
See more of
StellarNet's Reflectance probes and standards information!!!
StellarNet's Integrating
Spheres for Measurement-
The IC2 is a 2” internal diameter
sphere with 2 SMA connectors for illumination and collection
of solid samples. LS4" and LS6" are also available.
See
more about StellarNet's Integration Spheres!!!
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