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Thin Film
Measurement System
 StellarNet
has announced a surprisingly low cost Thin Film thickness measurement system,
covering a multitude of materials from 50Å-200μm thick. The non-contact
measurement system includes portable, rugged hardware and reliable,
user-friendly software. The large library of materials supports multilayer,
freestanding, rough, thick and thin layer structures. Thickness is measured
quickly and easily using reflectance spectroscopy with analysis provided in just
seconds. With USB2 connectivity, the powerful thin film software package
provides complex measurements via user configurable recipes and new materials
can be easily added.
Each system includes spectrometer(s) required for measurement of desired
thickness range. External light sources and a high quality reflectance probe
(with stand) allow for ultra-sensitive reflectometry measurements. Thickness
standards are also available in a variety of ranges, depending on the
measurement needs. The measurement process
consists of two steps: data acquisition and data analysis. TFCompanion defines
all the processes in a measurement recipe and makes it transparent to the user.
StellarNet Thin Film measurement systems are ideal for Solar PV Films (TFPVs)
including thin silicon, II-VI (primarily CdTe), CIGS, TCO stacks, and
polyamides. On-line thickness measurements of oxides, silicon nitride and many
other semiconductor process films are made quick and simple. Additionally,
in-situ measurement during MEMS patterning processes provides photoresist
uniformity and thickness. The system is also used by the automotive and
aviation industries to measure thickness of protective films and hardcoats.
Other typical applications include measurement of LCD & OLED displays, cell
gaps, and thickness of rough layers on substrates such as steel, aluminum,
brass, copper, or ceramics. From the most simple, routine measurements to
multilayer, multi-sample analysis – this system is ready to provide quick,
accurate analysis.
Thin Film Measurement System Page
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